Microelectronics Device Characterization

Located at: MIT, Cambridge, Massachusetts

The Microelectronics Device Characterization Lab allows remote testing of transistors and other microelectronics devices through the web from anywhere at anytime. Users measure the current-voltage characteristics of various microelectronics devices.

Conventional courses in microelectronic device physics rarely include a laboratory experience that exposes students to the workings of real devices. This is because of equipment, space, training, safety and staffing constraints that become nearly insurmountable the moment there are more than a dozen students in the class. Actual device characterization, however, can substantially enhance the educational experience. Students can compare their measured data on real devices with the theoretical expectations and reflect on discrepancies, limitations, and design criteria.

Currently, the system allows DC current-voltage characterization of multi-terminal devices using an HP4155B Semiconductor Parameter Analyzer. The system is configured with a Switching Matrix that provides access to up to eight devices. Some of the devices available for I-V characterization include pn diodes, nmos/pmos field effect transistors, and npn/pnp bipolar junction transistors. The user is able to change the operating conditions of the experiment such as bias voltages and currents, compliance values, voltage and current sweep ranges, etc. using a simple graphical interface. The results of the experiments are immediately displayed as graphs in the Parameter Analyzer applet console, and can be downloaded as a comma separated file for post-processing using MATLAB or any spread sheet application.