The Dynamic Signal Analyzer Lab allows users to perform frequency domain measurements on electronic circuits and control systems. While this instrument can perform a variety of measurements, this experiment focuses on its use in performing frequency response measurements (swept sine or FFT) on electronic filters, amplifier, and control circuits. Certain circuits-under-test may have additional control hardware.
The user interface for the Dynamic Signal Analyzer Lab is a Java applet that is derived from the software used for the Microelectronics Device Characterization Lab. This interface is a simplified version of the original lab client developed for this lab. A diagram describing the circuit-under-test is displayed in the interface, along with the experiment parameters supported for that circuit, in the upper half of the client. The lower half of the client contains the experiment results graphing module that displays the magnitude and phase components of the frequency response measurement as a function of input signal frequency. Currently, the Dynamic Signal Analyzer Lab supports a single circuit-under-test at any given time and the parameters for this circuit are transmitted to the client at launch.
Demonstration Video
| Topics/Standards it Teaches: | Electricity & Magnetism, Circuits |
| Correlating High School Course: | Supplemental/Enrichment for AP Physics B & C |
| Interaction Mode: | Asynchronous |
The iLab Network is supported in part by the National Science Foundation under grant OCI-0753324. However, any opinions, findings, conclusions, and/or recommendations are those of the investigators and do not necessarily reflect the views of the Foundation.